Inspection solutions
for advanced materials

Nonlinear optical coefficients evaluation

Optical axis determination

Electro-optic coefficients evaluation

Material engineering qualification (e.g.poling)

Degree of anisotropy assessment

Towards new manufacturing standards

The rise of AI, quantum computing, and 6G relies on a new generation of advanced materials that requires more stringent quality control than ever before.

At NLOPTICS, we are responding to this challenge with a nonlinear optical based technology that can reveal defects invisible to conventional methods, and support the industrialization of these strategic materials.

• • • Non-destructive and contactless : no alteration of samples, suitable for industrial processes in all circumstances.
    • Compatibility with advanced materials : LiNbO3, GaN, HfO2, SiC, AlN, SiO2, InP, GaAs, Al2O3, diamond, glass, metals, and more.
    • Direct access to functional properties : residual charges, degree of anisotropy, layer deposition homogeneity, crystal orientation.
    • Surface and thin film analysis : can detect nanometer-thick depositions, ideal for critical interfaces and contaminant detection.
    • Revealing the invisible : highlights defects, anomalies, and inhomogeneities that conventional optical methods cannot detect.
    • Supporting innovation : accelerates the integration of next-generation materials in photonics and semiconductors.